CVE-2023-21517 Vulnerability Details

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CVE-2023-21517 Metadata Quick Info

CVE Published: 28/06/2023 | CVE Updated: 02/08/2024 | CVE Year: 2023
Source: Samsung Mobile | Vendor: Samsung Mobile | Product: Samsung Mobile Devices
Status : PUBLISHED

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CVE-2023-21517 Description

Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.

Metrics

CVSS Version: 3.1 | Base Score: 8.8 HIGH
Vector: CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

l➤ Exploitability Metrics:
    Attack Vector (AV)* ADJACENT_NETWORK
    Attack Complexity (AC)* LOW
    Privileges Required (PR)* NONE
    User Interaction (UI)* NONE
    Scope (S)* UNCHANGED

l➤ Impact Metrics:
    Confidentiality Impact (C)* HIGH
    Integrity Impact (I)* HIGH
    Availability Impact (A)* HIGH

Weakness Enumeration (CWE)

CWE-ID: CWE-120
CWE Name: CWE-120: Buffer Copy without Checking Size of Input ('Classic Buffer Overflow')
Source: Samsung Mobile

Common Attack Pattern Enumeration and Classification (CAPEC)

CAPEC-ID:
CAPEC Description:


Source: NVD (National Vulnerability Database).