CVE-2021-42114 Vulnerability Details

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CVE-2021-42114 Metadata Quick Info

CVE Published: 16/11/2021 | CVE Updated: 17/09/2024 | CVE Year: 2021
Source: NCSC.ch | Vendor: Micron | Product: Micron ddr4_sdram
Status : PUBLISHED

CVE-2021-42114 Description

Modern DRAM devices (PC-DDR4, LPDDR4X) are affected by a vulnerability in their internal Target Row Refresh (TRR) mitigation against Rowhammer attacks. Novel non-uniform Rowhammer access patterns, consisting of aggressors with different frequencies, phases, and amplitudes allow triggering bit flips on affected memory modules using our Blacksmith fuzzer. The patterns generated by Blacksmith were able to trigger bitflips on all 40 PC-DDR4 DRAM devices in our test pool, which cover the three major DRAM manufacturers: Samsung, SK Hynix, and Micron. This means that, even when chips advertised as Rowhammer-free are used, attackers may still be able to exploit Rowhammer. For example, this enables privilege-escalation attacks against the kernel or binaries such as the sudo binary, and also triggering bit flips in RSA-2048 keys (e.g., SSH keys) to gain cross-tenant virtual-machine access. We can confirm that DRAM devices acquired in July 2020 with DRAM chips from all three major DRAM vendors (Samsung, SK Hynix, Micron) are affected by this vulnerability. For more details, please refer to our publication.

Metrics

CVSS Version: 3.1 | Base Score: 9 CRITICAL
Vector: CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:C/C:H/I:H/A:H

l➤ Exploitability Metrics:
    Attack Vector (AV)* NETWORK
    Attack Complexity (AC)* HIGH
    Privileges Required (PR)* NONE
    User Interaction (UI)* NONE
    Scope (S)* CHANGED

l➤ Impact Metrics:
    Confidentiality Impact (C)* HIGH
    Integrity Impact (I)* HIGH
    Availability Impact (A)* HIGH

Weakness Enumeration (CWE)

CWE-ID: CWE-20
CWE Name: CWE-20: Improper Input Validation
Source: Micron

Common Attack Pattern Enumeration and Classification (CAPEC)

CAPEC-ID:
CAPEC Description:


Source: NVD (National Vulnerability Database).